The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2010
Filed:
Feb. 13, 2007
Kuo-jeng Wang, Hsiao-Kang, Kaohsiung City, TW;
Kuo-Jeng Wang, Hsiao-Kang, Kaohsiung City, TW;
Other;
Abstract
A method for detecting a response of each probe zone on a test strip is provided. The present method includes providing a test strip having a color pattern displayed thereon. The color pattern occurs in response to a tested solution contacting with the test strip and including a plurality of color lines displayed in sequence from a bottom portion of the test strip to a top portion thereof. The site of each color line represents a probe zone of the test strip. Capturing a whole image of the test strip and selecting at least one scan line perpendicular to the image of the color lines therefrom. Setting a pixel position of the scan line having a minimum pixel value corresponding to a bottom edge of the test strip and using the pixel position as a reference to identify respective pixel positions of the color lines on the scan line so as to identify the image positions thereof on the whole image. A response of each probe zone of the test strip related to a gray level of a corresponding image position is thus obtained.