The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2010
Filed:
Mar. 14, 2007
Ewald Roessl, Ellerau, DE;
Andy Ziegler, Hamburg, DE;
Ewald Roessl, Ellerau, DE;
Andy Ziegler, Hamburg, DE;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
It is described a method for reducing noise of X-ray attenuation data related to a first and second spectral X-ray data acquisition. The method comprises the steps of (a) acquiring data representing the X-ray attenuation behavior of a region of interest, (b) determining a first and a second attenuation-base line integral for the first and the second X-ray acquisition, respectively, and (c) calculating expected first and second signal to noise ratios for the first and the second attenuation-base line integral based on given signal to noise ratios for the first and second spectral X-ray data acquisition, respectively. The method further comprises the steps of (d) repeating the above mentioned steps of determining the attenuation-base line integrals and calculating the expected signal to noise ratios for a further first spectral X-ray data acquisition and (e) selecting improved spectral X-ray data acquisitions in order to enhance the overall signal to noise ratio of a final X-ray image.