The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2010

Filed:

Jun. 14, 2004
Applicants:

Oleg Zaboronski, Coventry, GB;

Nicholas Atkinson, Warwickshire, GB;

Robert Charles Jackson, Warwick, GB;

Theo Drane, Warwickshire, GB;

Andrei Vityaev, San Jose, CA (US);

Inventors:

Oleg Zaboronski, Coventry, GB;

Nicholas Atkinson, Warwickshire, GB;

Robert Charles Jackson, Warwick, GB;

Theo Drane, Warwickshire, GB;

Andrei Vityaev, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 5/12 (2006.01); H03M 13/03 (2006.01);
U.S. Cl.
CPC ...
Abstract

A calculator for use in a maximum likelihood detector, including: a receiver for receiving convolution encoded data which may include noise; first calculator for calculating a first component of a first path metric difference between two possible sequences of states corresponding to the convolution encoded data, the two sequences each having a length equal to a constraint length of the convolution encoded data, and the two sequences starting at a same state and ending at a same state, adapted to calculate the first component using the convolution-encoded data and using convolution encoding parameters of the convolution-encoded data, wherein the first component is independent of the two sequences; and second calculator for calculating a second component of the first path metric difference using the two sequences, wherein the second component is independent of the convolution encoded data; and using the first and second components to obtain the first path metric difference.


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