The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2010

Filed:

Sep. 09, 2005
Applicants:

Scott M. Carlson, Tucson, AZ (US);

Michel Henri Théodore Hack, Cortlandt Manor, NY (US);

LI Zhang, Yorktown Heights, NY (US);

Inventors:

Scott M. Carlson, Tucson, AZ (US);

Michel Henri Théodore Hack, Cortlandt Manor, NY (US);

Li Zhang, Yorktown Heights, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04J 3/06 (2006.01); G06F 1/12 (2006.01); G06F 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed are a method and system to estimate the maximum error in the clock offset and skew estimation between two clocks in a computer system. The method comprises the steps of obtaining a first set of data values representing a forward delay between the first and second clocks, and obtaining a second set of data values representing a negative backward delay between the first and second clocks. The method comprises the further step of forming a lower convex hull for said first set of data values, and forming an upper convex hull for said second set of data values. First and second parallel lines are formed between the upper and lower convex hulls, and these parallel lines are used to estimate the worst case error for the offset, skew rate and dispersion of said first and second clocks.


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