The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2010
Filed:
Oct. 10, 2007
Applicant:
Naoki Shimma, Kawasaki, JP;
Inventor:
Naoki Shimma, Kawasaki, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The method and apparatus can register defective areas in a recording medium not having a dedicated sparing area. A data recording area and a sparing area are not preliminarily divided. When a defective area is found, data is transferred to another area in the recording area, and the defective area is registered as being in a recorded state in a table for managing the recorded state in each of the recording areas.
Shimma, Naoki. (2010). Method and apparatus for recording information onto and reproducing information from a recording medium and managing a defective area in a recording medium (U.S. Patent No. 7821894). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7821894
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile