The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2010
Filed:
Apr. 20, 2006
Kazuhiro Hayashi, Akishima, JP;
Keiji Shimizu, Fussa, JP;
Kazuhiro Hayashi, Akishima, JP;
Keiji Shimizu, Fussa, JP;
Olympus Corporation, Tokyo, JP;
Abstract
The exposure time for obtaining a bright image in an image-acquisition optical system can be reduced, and shifting of an image visually observed in an observation optical system is prevented, thus enabling stable observation. A microscope including an image-acquisition optical path for recording an image focused by an objective lens and an observation optical path for visually observing an image split-off from the image-acquisition optical path; and including an aperture stop, in the observation optical path, for stopping down the numerical aperture thereof to smaller than the numerical aperture of the image-acquisition optical path.