The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2010
Filed:
Mar. 05, 2008
Clark Alexander Bendall, Syracuse, NY (US);
Guiju Song, Shanghai, CN;
LI Tao, Shanghai, CN;
Kevin George Harding, Niskayuna, NY (US);
Thomas Karpen, Skaneateles, NY (US);
Clark Alexander Bendall, Syracuse, NY (US);
Guiju Song, Shanghai, CN;
Li Tao, Shanghai, CN;
Kevin George Harding, Niskayuna, NY (US);
Thomas Karpen, Skaneateles, NY (US);
GE Inspection Technologies, LP, Lewiston, PA (US);
Abstract
A probe includes an insertion tube and a plurality of light emitters disposed on the distal end of the insertion tube. The probe further includes at least one intensity modulating element through which light from the plurality of light emitters is passed to project a plurality of fringe sets onto a surface. Each of the plurality of fringe sets intern have a structured-light pattern that is projected when one emitter group of at least one of the plurality of light emitters is emitting. The probe further includes an imager for obtaining at least one image of the surface and a processing unit that is configured to perform phase-shift analysis on the at least one image. A method for projecting a plurality of fringe sets suitable for phase-shift analysis on a surface using a probe is also presented.