The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2010
Filed:
Jan. 11, 2007
Mitsuhiko Sano, Tokyo, JP;
Kazuhiro Ohara, Tokyo, JP;
Mitsuhiko Sano, Tokyo, JP;
Kazuhiro Ohara, Tokyo, JP;
Abstract
A microstructural feature and material property monitoring device for a metallic material that can easily adjust relative position between an irradiation position of laser beams applied to the metallic material to propagate pulsed ultrasonic waves in the metallic material and detection position of a laser interferometer, and therefore can accurately monitor the microstructural feature and material property of the metallic material. The device relatively moves the irradiation position of the laser beams generated by a laser oscillator and the detection position of the laser interferometer. The irradiation position of the laser beams generated from a laser oscillator and the detection position of the laser interferometer are controlled to be aligned with a relative position according to the microstructural feature and material property of the metallic material based on the time from the transmission of the pulsed ultrasonic waves to the detection by the laser interferometer. After the alignment, the microstructural feature and material property of the metallic material is calculated based on the waveform of the pulsed ultrasonic waves generated as an electrical signal by the laser interferometer.