The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2010
Filed:
Sep. 05, 2007
Paul G. Amazeen, Cleveland, OH (US);
Felix I. Feldchtein, Framingham, MA (US);
Paul G. Amazeen, Cleveland, OH (US);
Felix I. Feldchtein, Framingham, MA (US);
Imalux Corporation, Cleveland, OH (US);
Abstract
Provided are common path frequency domain and time domain OCT systems and methods that use non-specular reference reflection for obtaining internal depth profiles and depth resolved images of samples. Further provided is a delivering device for optical radiation, preferably implemented as an optical fiber probe with a partially optically transparent non-specular reflector placed in the vicinity of an associated sample. High frequency fringes are substantially reduced and a stable power level of the reference reflection is provided over the lateral scanning range. The partially optically transparent non-specular reflector is implemented as a coating placed on the interior surface of the optical probe window including spots of a metal, or a dielectric coating, separated by elements of another coating or just spaces of a clean substrate. In an alternative embodiment, the scattering elements are made 3-dimensional, having, for example, a spherical shape.