The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2010
Filed:
Jun. 16, 2009
Applicants:
Igor Y. Khandros, Orinda, CA (US);
Benjamin N. Eldridge, Danville, CA (US);
Charles A. Miller, Fremont, CA (US);
A. Nicholas Sporck, Saratoga, CA (US);
Inventors:
Igor Y. Khandros, Orinda, CA (US);
Benjamin N. Eldridge, Danville, CA (US);
Charles A. Miller, Fremont, CA (US);
A. Nicholas Sporck, Saratoga, CA (US);
Assignee:
FormFactor, Inc., Livermore, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A test system for testing electronic devices can include a plurality of testers and a test station. The test station can include probes to contact the devices and the tester can control testing. Test data can be received by the test station from the testers using wireless communications links.