The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2010

Filed:

Jan. 09, 2008
Applicants:

H. Bernhard Pogge, Hopewell Junction, NY (US);

Roy R. Yu, Poughkeepsie, NY (US);

Inventors:

H. Bernhard Pogge, Hopewell Junction, NY (US);

Roy R. Yu, Poughkeepsie, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 23/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A vertical wafer-to-wafer interconnect structure is provided in which a first wafer and a second wafer are mated by way of metal studs that extend from a surface of the first wafer. The metal studs extend from the surface of the first wafer into a corresponding through via of the second wafer. A polyimide coating is present in the through via on mated surfaces of the first and second wafers and on another surface of the second wafer not mated to the first wafer, thus the metal studs provide a continuous metal path from the first wafer through the second wafer. Since only metal studs for the vertical connection are used, no alpha radiation is generated by the metal studs.


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