The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2010
Filed:
Feb. 28, 2008
Katashi Ishihara, Center Valley, PA (US);
Hitoshi Hatano, Hino, JP;
Katashi Ishihara, Center Valley, PA (US);
Hitoshi Hatano, Hino, JP;
Olympus Corporation, Tokyo, JP;
Abstract
An improved laser scanning microscope and method of use are disclosed that enable polarization anisotropy measurements to be made with greater sensitivity and accuracy. A controllable optical element is provided in a light path between a laser source and a sample, and is controlled so that the sample is alternately irradiated with light beams that are orthogonally polarized. This enables the signal strength to be higher than with previous laser scanning microscopes. Moreover, because the orthogonally polarized light beams that are alternately incident onto a sample may be switched at a high rate, a reduction may be achieved in the influence of molecular motion within a sample in which high speed biological reactions are observed.