The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2010

Filed:

May. 05, 2006
Applicants:

Jean-roch Rinfret, St-Nicolas, CA;

Jean-luc Lessard, Sherbrooke, CA;

Pierre Poulin, Québec, CA;

Maxime Diamond, Québec, CA;

Inventors:

Jean-Roch Rinfret, St-Nicolas, CA;

Jean-Luc Lessard, Sherbrooke, CA;

Pierre Poulin, Québec, CA;

Maxime Diamond, Québec, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23Q 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for monitoring the quality of log cutting either off-line or in real-time is based on optical measurement of half-squared or full-squared cants characteristics as produced at primary or secondary cutting stage, so as to increase the proportion of high-value wood pieces that can be recovered from full squared-cants produced at the sawing stage. The log is fed lengthwise to a primary cutting station (canter) capable of producing the first pair of opposing cut faces, while guiding the log substantially in a direction of the machine axis. The profile of the peripheral log surface at a plurality of cross-sections along the machine axis is measured to generate corresponding post-cut profile data, from which an estimation of log raw profile characteristics is made, to generate corresponding raw profile data. Then, from post-cut and raw profile data, resulting data on at least one parameter related to the cutting quality of the log. The proposed monitoring system and method provide accurate control of target dimensions, while optimizing the adjustment of other quality related parameters such as faces parallelism and cant centering, as well as to measure the level of some surface defects generated at cutting such as knife marks, stripping and roughness, in order to obtain a more complete performance diagnostic.


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