The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2010

Filed:

May. 30, 2006
Applicants:

Yuqun Chen, Bellevue, WA (US);

Gang Tan, Brighton, MA (US);

Inventors:

Yuqun Chen, Bellevue, WA (US);

Gang Tan, Brighton, MA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A tamper response mechanism introduces a delayed failure into a program in response to detected tampering with the program. The mechanism determines a manner of responding to the detected tampering. The manner of responding may include corrupting a global pointer or using other techniques. The mechanism also determines when to respond to the tampering and implements the response at the determined time.


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