The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2010

Filed:

Feb. 01, 2006
Applicants:

Athijegannathan Sundararajan, Chennai, IN;

Sanjay R. Radia, Fremont, CA (US);

Sanjeev Krishnan, Bangalore, IN;

Inventors:

Athijegannathan Sundararajan, Chennai, IN;

Sanjay R. Radia, Fremont, CA (US);

Sanjeev Krishnan, Bangalore, IN;

Assignee:

Oracle America, Inc., Redwood City, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for dynamic application tracing in virtual machine environments comprises receiving an instrumentation request that includes an identification of a probe point at which instrumentation code is to be inserted within an application. The method may further comprise making a determination whether the instrumentation code meets one or more acceptance criteria. If the instrumentation code is found to be acceptable, the method may further comprise inserting the instrumentation code at the probe point within the application while the application is executing within a virtual machine, and obtaining information indicative of application state from an execution of the instrumentation code when the probe point is reached during application execution.


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