The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2010
Filed:
Jun. 22, 2006
Robert M. Russin, Austin, TX (US);
Larry D. Barto, Austin, TX (US);
David A. Richardson, Austin, TX (US);
Donald Craig Likes, Austin, TX (US);
Russell C. Brown, Austin, TX (US);
Robert M. Russin, Austin, TX (US);
Larry D. Barto, Austin, TX (US);
David A. Richardson, Austin, TX (US);
Donald Craig Likes, Austin, TX (US);
Russell C. Brown, Austin, TX (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
A method includes transforming, based on a first transform, a first markup language document associated with a first version of a schema to generate a second markup language document associated with a second version of the schema. The second markup language document is representative of a third markup language document associated with the second version of the schema and the first transform represents a transform from the first version of the schema to the second version of the schema. The method further includes comparing the second markup language document to the third markup language document to identify whether at least one discrepancy exists between the second markup language document and the third markup language document. The method additionally includes determining a suitability of the first transform based on the comparison of the second markup language document to the third markup language document.