The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2010

Filed:

May. 19, 2006
Applicants:

Eun-joo Lee, Cupertino, CA (US);

Christine Hau-riege, Fremont, CA (US);

Inventors:

Eun-Joo Lee, Cupertino, CA (US);

Christine Hau-Riege, Fremont, CA (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08C 25/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to one exemplary embodiment, a computer implemented method for detecting multiple failure modes in a set of electromigration failure data points includes sorting the data points by time to failure and dividing the data points to form first and second groups of data points to determine a first combination of first and second seed groups of data points providing an initial highest weighted R-square. The method further includes defining an intermediate group of data points shared between the first and second seed groups of data points and grouping the intermediate group of data points with the first and second seed groups of data points to determine a second combination of the first and second seed groups of data points providing a final highest weighted R-square. The initial highest weighted R-square is then compared to the final highest weighted R-square.


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