The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2010
Filed:
Mar. 20, 2007
Jyoti Kumar Bansal, San Francisco, CA (US);
David Isaiah Seidman, San Francisco, CA (US);
Jyoti Kumar Bansal, San Francisco, CA (US);
David Isaiah Seidman, San Francisco, CA (US);
Computer Associates Think, Inc., Islandia, NY (US);
Abstract
Anomalous behavior in a distributed system is automatically detected. Metrics are gathered for transactions, subsystems and/or components of the subsystems. The metrics can identify response times, error counts and/or CPU loads, for instance. Baseline metrics and associated deviation ranges are automatically determined and can be periodically updated. Metrics from specific transactions are compared to the baseline metrics to determine if an anomaly has occurred. A drill down approach can be used so that metrics for a subsystem are not examined unless the metrics for an associated transaction indicate an anomaly. Further, metrics for a component, application which includes one or more components, or process which includes one or more applications, are not examined unless the metrics for an associated subsystem indicate an anomaly. Multiple subsystems can report the metrics to a central manager, which can correlate the metrics to transactions using transaction identifiers or other transaction context data.