The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2010

Filed:

Jan. 30, 2006
Applicant:

Shigeo Ishikawa, Kawasaki, JP;

Inventor:

Shigeo Ishikawa, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A technique that can obtain right results of a simulation if the user does not have sophisticated knowledge about strength analysis simulations is provided. An analysis data judging apparatus comprises an analysis results acquiring section that acquires analysis data relating to the results of analysis of a strength analysis simulation executed for an object of analysis model and a judging section that determines whether the analysis data acquired by the analysis results acquiring section shows a predetermined deformed state of a predetermined part according to the threshold value set for the predetermined part of the object of analysis model or not.


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