The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2010

Filed:

Mar. 28, 2005
Applicants:

Tomohiro Tsubota, Nagoya, JP;

Norichika Kimura, Nagoya, JP;

Shigeo Kambe, Okazaki, JP;

Inventors:

Tomohiro Tsubota, Nagoya, JP;

Norichika Kimura, Nagoya, JP;

Shigeo Kambe, Okazaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 17/00 (2006.01); G06F 11/30 (2006.01); G21C 17/013 (2006.01); F02P 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

When the mobile inspection terminal determines that the inspection standard information received from a server is the 'specification', it displays the received inspection standard information and out-of-standard specification information on a liquid crystal display. When it is confirmed in this state that selected inspection standard information is input, whether or not an part to be inspected is acceptable is determined based on the inspection standard information, and the server is notified of a result of determination. Further, when it is determined that the inspection standard information is the 'measured value', a measured value input screen is displayed on the liquid crystal display. When it is confirmed in this state that a measured value is input, whether or not the part to be inspected is acceptable or not is determined based on the input information, and the server is notified of a result of determination.


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