The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2010
Filed:
Jan. 08, 2007
Kejun Kang, Beijing, CN;
Haifeng HU, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Shangmin Sun, Beijing, CN;
Guang Yang, Beijing, CN;
Fengjun Zhang, Beijing, CN;
Yong BI, Beijing, CN;
Yucheng Wu, Beijing, CN;
Jianjun LI, Beijing, CN;
Rongxuan Liu, Beijing, CN;
Kejun Kang, Beijing, CN;
Haifeng Hu, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Shangmin Sun, Beijing, CN;
Guang Yang, Beijing, CN;
Fengjun Zhang, Beijing, CN;
Yong Bi, Beijing, CN;
Yucheng Wu, Beijing, CN;
Jianjun Li, Beijing, CN;
Rongxuan Liu, Beijing, CN;
Tsinghua University, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Abstract
Disclosed is an inspection system for inspecting a cargo by using radiation, comprising: a main plate conveyor; a radiation scanning unit that spans said main plate conveyor and is provided above said main plate conveyor, for scanning the cargo provided on the main plate conveyor; auxiliary conveyors that are provided at the front end and rear end of said main plate conveyor, respectively, so as to load the cargo to be inspected onto said main plate conveyor and to unload the inspected cargo from said main plate conveyor; and lifting devices for lifting said auxiliary conveyors. The inspection system according to the present invention occupies less area, has simple corollary equipments, a lower operating cost, and excellent compatibility, and can be widely applied.