The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2010
Filed:
May. 07, 2004
Euihyun Paik, Daejon, KR;
Tae-il Kim, Daejon, KR;
Hyeong-ho Lee, Daejon, KR;
Electronics and Telecommunications Research Institute, Daejeon, KR;
Abstract
Provided are a method for measuring characteristics of a path between nodes by using active testing packets based on priority, i.e., an inter-node path characteristic measuring method, which can measure and provide characteristics of a generated node, when an inter-node data transmission path is generated based on Multi-Protocol Label Switching (MPLS) to provide a path with satisfactory transmission delay, jitter and packet loss that are required by a user, and to provide a computer-readable recording medium for recording a program that implement the method. The method includes the steps of: a) synchronizing system time of the nodes with a global standard time; b) forming each testing packet; c) registering frame sequence and the global standard time during transmission; and d) calculating transmission delay time, jitter and packet loss by using time stamp and packet sequence information of a frame received by the destination node and transmitting the result to the management system.