The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2010
Filed:
Jan. 21, 2003
Masayoshi Takahashi, Yokohama, JP;
Ritsuro Orihashi, Tokyo, JP;
Wen LI, Yokohama, JP;
Shinji Homma, Nakai, JP;
Masayoshi Takahashi, Yokohama, JP;
Ritsuro Orihashi, Tokyo, JP;
Wen Li, Yokohama, JP;
Shinji Homma, Nakai, JP;
Abstract
An inspection apparatus and method are disclosed for inspecting a magnetic disk or a magnetic head. A first reference signal generating source generates reference signals of a controllable oscillating frequency, and a signal switching means selects either a reference signal or test data reproduced by the magnetic head. Factors such as offsets and gain differentials among signal distribution paths, phase shifts of sampling clocks supplied to a plurality of AID converters, and frequency-dependence of the transfer function and phase response of signal paths are identified so that errors due to these factors can be detected. Based on the detected values of these factors and errors, reference signals are utilized to compensate test data errors.