The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2010
Filed:
Dec. 18, 2007
Chengwu Cui, Lexington, KY (US);
Mark Lane Mayberry, Nicholasville, KY (US);
Karl Mark Thompson, Midway, KY (US);
Chengwu Cui, Lexington, KY (US);
Mark Lane Mayberry, Nicholasville, KY (US);
Karl Mark Thompson, Midway, KY (US);
Lexmark International, Inc., Lexington, KY (US);
Abstract
A method for adjusting a controller of a scanner includes obtaining a scan of a predefined image. The method further includes moving the sensor-element signals of the control signal pattern generated by the controller earlier in the pattern by at least one unit and obtaining an additional scan. The obtaining and moving are repeated until a comparison of a latest additional scan to the image is worse than a comparison of a second-latest additional scan to the image. Another method obtains a noise-reducing heuristic which modifies a time parameter of a sensor-element signal. A set of repeated scans of a same scan line is obtained, noise is measured there from, the time parameter is modified by one predetermined unit, and the process repeats until the noise measured from the latest set of repeated scans is worse than that from the second-latest set of repeated scans.