The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2010
Filed:
Mar. 07, 2007
Daisuke Ishida, Tokyo, JP;
Hiroyuki Nose, Tokyo, JP;
Namio Kaneko, Tokyo, JP;
Mitsuru Uesaka, Tokyo, JP;
Fumito Sakamoto, Tokyo, JP;
Katsuhiro Dobashi, Tokyo, JP;
Daisuke Ishida, Tokyo, JP;
Hiroyuki Nose, Tokyo, JP;
Namio Kaneko, Tokyo, JP;
Mitsuru Uesaka, Tokyo, JP;
Fumito Sakamoto, Tokyo, JP;
Katsuhiro Dobashi, Tokyo, JP;
IHI Corporation, Tokyo, JP;
The University of Tokyo, Tokyo, JP;
National Institute of Radiological Sciences, Chiba, JP;
Abstract
A device for measuring profiles of an electron beam and a laser beam is provided with a profile measuring devicefor measuring cross-section profiles of the beams in the vicinity of a collision position where an electron beamand a laser beamare brought into frontal collision, and a moving devicefor continuously moving the profile measuring device in a predetermined direction which substantially coincides with the axial directions of the beams. Furthermore, based on the cross-section profiles measured by the profile measuring device, the position of the profile measuring device in the predetermined direction, and the oscillation timings of the beams, temporal changes in three-dimensional profiles of the electron beam and the laser beam are created by a profile creating device