The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2010
Filed:
Dec. 22, 2006
Soo-choon Kang, San Jose, CA (US);
Remmelt Pit, Palo Alto, CA (US);
Soo-Choon Kang, San Jose, CA (US);
Remmelt Pit, Palo Alto, CA (US);
Hitachi Global Storage Technologies Netherlands B.V., Amsterdam, NL;
Abstract
In one embodiment and method of the present invention, an optical interference fly height (FH) test apparatus for measuring FH is disclosed, in accordance with an embodiment of the present invention, to include a slider, a transparent disk, means for directing a light beam directed between the slider and the disk, and means for iteratively measuring an estimated FH using at least two points of measurement on the slider when the slider is moved away from the disk at a pitch angle, wherein the estimated FH is computed as a function of the pitch angle and during each iteration, a previously-estimated FH is used to converge the estimated FH so that the estimated FH is within a predetermined range from the actual FH.