The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2010

Filed:

Aug. 24, 2005
Applicants:

Bernardus Leonardus Gerardus Bakker, Eindhoven, NL;

Michael Cornelis Van Beek, Eindhoven, NL;

Gérald Lucassen, Eindhoven, NL;

Marjolein Van Der Voort, Eindhoven, NL;

Wouter Harry Jacinth Rensen, Eindhoven, NL;

Inventors:

Bernardus Leonardus Gerardus Bakker, Eindhoven, NL;

Michael Cornelis Van Beek, Eindhoven, NL;

Gérald Lucassen, Eindhoven, NL;

Marjolein Van Der Voort, Eindhoven, NL;

Wouter Harry Jacinth Rensen, Eindhoven, NL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a spectroscopic system as well as a method of autonomous tuning of a spectroscopic system and a corresponding computer program product. By detecting the position of return radiation in a transverse plane of an aperture of a spectroscopic analysis unit, a control signal can be generated that allows to drive servo driven translation or tilting stages of optical components. In this way a transverse misalignment of a spectroscopic system can be effectively detected. Generally, a plurality of different detection schemes are realizable allowing for an autonomous tuning of the spectroscopic system and for autonomous elimination of misalignment of a spectroscopic system.


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