The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2010
Filed:
Mar. 29, 2007
Ronald Jacob Smith, Belle Plaine, MN (US);
John George Gerogeorge, Chanhassen, MN (US);
Sham Sunder Nayar, Savage, MN (US);
Mark Curtis Fahrendorff, New Prague, MN (US);
Shawn Stephen Silewski, Eden Prairie, MN (US);
Ronald Jacob Smith, Belle Plaine, MN (US);
John George Gerogeorge, Chanhassen, MN (US);
Sham Sunder Nayar, Savage, MN (US);
Mark Curtis Fahrendorff, New Prague, MN (US);
Shawn Stephen Silewski, Eden Prairie, MN (US);
Seagate Technology LLC, Scotts Valley, CA (US);
Abstract
An apparatus and associated method for measuring spatial characteristics of a test object with stacked features. First and second measurement assemblies for measuring opposing first and second planar features, respectively, of a test object, by directing light beams into a gap between the features to measure a position and a static attitude of each feature.