The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2010
Filed:
Aug. 29, 2006
Eric W. Westerfield, Verailles, KY (US);
Craig P. Bush, Lexington, KY (US);
Eric W. Westerfield, Verailles, KY (US);
Craig P. Bush, Lexington, KY (US);
Lexmark International, Inc., Lexington, KY (US);
Abstract
In a bi-directionally scanning electrophotographic (EP) device, methods and apparatus include storing alignment information. In one aspect, pre-characterization parameters of the EP device are stored in memory, such as NVRAM, resistant to the removal of power. In another, actual parameters of the EP device are learned during calibration and stored in the same memory. A controller has local or remote access to the memory and makes comparisons of the pre-characterized and learned parameters to implement corrections. Especially, scan alignment corrections are implemented to alter future scanning of scan lines of latent images on a photoconductor whereby the scan lines are formed in alternating directions. Certain contemplated parameters include, but are not limited to, a scan detect to print distance from a sensor to the start of imaging, temperature, pressure, a scanning mechanism drive signal parameter, such as pulse width, or sensor delay information.