The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2010
Filed:
Jul. 29, 2005
Pattabhiraman Krishna, Westborough, MA (US);
Jeffrey H. Fischer, Boston, MA (US);
David J. Husak, Windham, NH (US);
Robert A. Stephenson, Carlisle, MA (US);
Pattabhiraman Krishna, Westborough, MA (US);
Jeffrey H. Fischer, Boston, MA (US);
David J. Husak, Windham, NH (US);
Robert A. Stephenson, Carlisle, MA (US);
Reva Systems Corporation, Chelmsford, MA (US);
Abstract
A system and method of scheduling RFID tag interrogations by a plurality of RFID readers so as to mitigate the effects of interference within an RFID environment in which the readers are deployed, and to enhance the efficiency and reliability of the overall RFID system. The system includes a plurality of RFID receivers for receiving RFID tag data, a plurality of RFID tag interrogators for transmitting RF interrogation signals for interrogating RFID tags, and a controller for providing to at least one interrogator, at least one receiver, and at least one tag, a parameter associated with operational characteristics of the interrogator, the receiver, and the tag, respectively. The interrogator, the receiver, and the tag are operative, in response to receipt of the respective parameter, to modify its operational characteristics in accordance with the respective parameter, thereby avoiding interference at the receivers and the tags.