The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2010
Filed:
Jul. 02, 2008
Young-ki Kwak, Cheonan-si, KR;
Chul-woong Jang, Cheonan-si, KR;
Woon-sup Choi, Cheonan-si, KR;
Jong-pil Park, Cheonan-si, KR;
Young-Ki Kwak, Cheonan-si, KR;
Chul-Woong Jang, Cheonan-si, KR;
Woon-Sup Choi, Cheonan-si, KR;
Jong-pil Park, Cheonan-si, KR;
Samsung Electronics Co., Ltd., Suwon-Si, KR;
Abstract
An apparatus for testing an object includes a test chamber, a guiding member, testing units and a transferring unit. The test chamber is configured to receive the object. The guiding member is arranged extending along a first direction in the test chamber. The testing units are movably connected to the guiding member to test electrical characteristics of the object. The transferring unit is arranged in the test chamber to load the object into one of the testing units and unload the object from one of the testing units. The testing units may be transferred to a position for repair without suspension of the apparatus. The object may be tested using another testing unit while the other testing unit is being repaired.