The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2010
Filed:
Apr. 27, 2006
Applicant:
Akio Tanaka, Tokyo, JP;
Inventor:
Akio Tanaka, Tokyo, JP;
Assignee:
NEC Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01H 47/32 (2006.01); G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A plurality of circuit blocks are provided in a semiconductor device which collects and corrects impairment quantities of discretionary areas in a circuit group of various types having random couplings. The semiconductor device is provided with a detector, which is arranged in each circuit block and detects an electric signal of an element in the circuit block; a wiring wherein each detector output passes through; a plurality of switches for feeding the wiring with each detector output; and a buffer connected to the wiring and passes through a direct current voltage.