The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2010

Filed:

Feb. 28, 2006
Applicant:

David B. Agus, Beverly Hills, CA (US);

Inventor:

David B. Agus, Beverly Hills, CA (US);

Assignee:

Cedars-Sinai Medical Center, Los Angeles, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/26 (2006.01); H01J 49/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a system and method for mass spectrometry () that allows for bi-directional introduction of collections of charged particles into the magnetic field of a mass spectrometer. More particularly, the present invention includes a system for mass spectrometry () (e.g., an FTMS mass spectrometer) with a cylindrical magnet () configured to receive and measure the cyclotron frequencies () of charged particles that are introduced () into the cylindrical magnet () from either of the two axial ends thereof. Methods of the invention relate to performing mass spectrometry analysis on collections of charged particles that are introduced (), serially, simultaneously or both, into a cylindrical magnet () from opposing axial ends thereof. The present invention exhibits significantly increased magnet throughput relative to currently available devices, by allowing flow in the opposite direction to a second detector, e.g., during ion processing time of a first detector.


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