The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2010

Filed:

Jul. 27, 2007
Applicants:

Shilin Guo, San Diego, CA (US);

Guo LI, San Diego, CA (US);

Rob Patrick Chohan, San Diego, CA (US);

Julie Huynh, San Diego, CA (US);

Inventors:

Shilin Guo, San Diego, CA (US);

Guo Li, San Diego, CA (US);

Rob Patrick Chohan, San Diego, CA (US);

Julie Huynh, San Diego, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 29/38 (2006.01); B41J 29/393 (2006.01);
U.S. Cl.
CPC ...
Abstract

Preferably, test-patterns print on separate, multiple print-medium cards, each including a ramp with colors graded along a certain direction—and, superimposed on the ramp, a candidate add-on colorant. Ramps preferably are printed in so-called 'customer colors', common in snapshots and particularly snapshot regions that include sky. Positions or amounts of the candidate add-on colorant canvass a likely range of values that optimize camouflaging or suppression of a banding artifact (due to seams in the pagewide array) that is extended along the same certain direction. For each seam and each 'customer color' used, an operator holds up several cards for comparison, selecting the best one to three. Operators thus can evaluate candidate colorant patterns in context of many different tones of the sky and other customer colors. Preferably banding suppression is integrated with linearization: at each seam a series of linearization tables is smoothly interpolated between measurement-based tables for adjacent inkjet dice.


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