The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2010
Filed:
Apr. 23, 2008
Applicants:
Chao-fa Lee, Taipei, TW;
Cheng-hsing Kuo, Taipei, TW;
Tsong-rong Yan, Taipei, TW;
Inventors:
Assignee:
Tatung Company, Taipei, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01G 11/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
A dual mode measurement system with quartz crystal microbalance (QCM) is provided, which includes a quartz sensing component, a first measurement circuit, a second measurement circuit and a switch unit. When the first measurement circuit is selected through the switch unit, the first measurement circuit and the quartz sensing component form an oscillation circuit and output a resonance signal. When the second measurement circuit is selected through the switch unit, the second measurement circuit outputs a frequency scanning signal to scan the quartz sensing component, so as to output an impedance sensing signal.