The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2010

Filed:

Dec. 18, 2006
Applicants:

Seockhoon Bae, Cupertino, CA (US);

Donghoon Lee, Seoul, KR;

Changyoon Yang, Sungnam, KR;

Inventors:

Seockhoon Bae, Cupertino, CA (US);

Donghoon Lee, Seoul, KR;

Changyoon Yang, Sungnam, KR;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

Programmatic extraction and management of solid and surface modeling parameters from raw 3D scan data is discussed. An automated process reads raw 3D scan data and works in communication with a CAD system able to perform CAD part modeling. The user is provided with an automatic function to segment a mesh model (formed from the raw 3D scan data) into dozens of mesh regions. A graphical user interface is provided which enables a user to choose a type of the design intent along with the mesh regions from which the design intent is calculated. Each design intent is represented in a vector, a plane or a poly-line depending upon the type of design intent. In response to a user demand for the parameters of a modeling feature, a best approximation of the requested parameter value is calculated by processing the raw 3D scan data using a set of functions.


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