The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2010
Filed:
May. 08, 2008
John Joseph Seibold, Dallas, TX (US);
Vinay B. Jayaram, Allen, TX (US);
Elie Torbey, Dallas, TX (US);
John Joseph Seibold, Dallas, TX (US);
Vinay B. Jayaram, Allen, TX (US);
Elie Torbey, Dallas, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A test system in an integrated circuit includes at least one boundary scan cell. The boundary scan cell includes a first storage element and a second storage element connected in series with the first storage element. The boundary scan cell also includes test logic configured to provide a test completion signal indicative of completion of a respective test based on a comparison of an output of the first storage element relative to test value (TVALUE). The output of the first storage element is provided to the input of the second storage element unchanged during a first operating state and, depending on the test completion signal, an inverted version of the output of the first storage element can be provided to the input of the second storage element during a second operating state. A bi-directional element is connected to receive the output of the second storage element and to feed the output of the second storage element back to an input of the first storage element.