The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2010
Filed:
May. 18, 2008
Applicants:
Roberto Fabian Averbuj, San Diego, CA (US);
David W. Hansquine, Raleigh, NC (US);
Inventors:
Roberto Fabian Averbuj, San Diego, CA (US);
David W. Hansquine, Raleigh, NC (US);
Assignee:
QUALCOMM Incorporated, San Diego, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Built-in self-test (BIST) architecture having distributed interpretation and generalized command protocol is disclosed. In an embodiment, a system is disclosed and includes a centralized built-in self-test (BIST) controller configured to store an algorithm to test a plurality of memory modules. The BIST controller stores the algorithm as a set of generalized commands that conform to a command protocol. The BIST controller is configured to send the set of generalized commands to a sequencer.