The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2010
Filed:
May. 31, 2007
Neil Holger White Eklund, Schenectady, NY (US);
Weizhong Yan, Clifton Park, NY (US);
Varma Anil, Clifton Park, NY (US);
Piero Patrone Bonissone, Schenectady, NY (US);
Neil Holger White Eklund, Schenectady, NY (US);
Weizhong Yan, Clifton Park, NY (US);
Varma Anil, Clifton Park, NY (US);
Piero Patrone Bonissone, Schenectady, NY (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
A method and system for automatically developing a fault classification system from time series data. The sensors need not have been intended for diagnostic purposes (e.g., control sensors). These methods and systems are functionally independent of knowledge related to a particular equipment system, thereby allowing seamless application to multiple systems, regardless of the suite of sensors in each system. Because this algorithm is totally automated, substantial savings in time and development cost can be achieved. The algorithm results in a classification system and a set of features that might be used to develop alternative classification systems without human intervention.