The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2010
Filed:
Jan. 24, 2007
Applicants:
Mitsuo Takeda, Chofu, JP;
Wei Wang, Edinburgh, GB;
Tomoaki Yokozeki, Matsuyama, JP;
Reika Ishijima, Kawasaki, JP;
Yu Qiao, Kashiwa, JP;
Inventors:
Mitsuo Takeda, Chofu, JP;
Wei Wang, Edinburgh, GB;
Tomoaki Yokozeki, Matsuyama, JP;
Reika Ishijima, Kawasaki, JP;
Yu Qiao, Kashiwa, JP;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A displacement detection method detects a displacement from phase singularities before and after the displacement, by specifying the phase singularities based on predetermined elements by acquiring the elements from a phase structure of the phase singularities, and detecting positions of the phase singularities after the displacement based on the elements acquired by specifying of the phase singularity.