The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2010

Filed:

Dec. 15, 2006
Applicants:

Tae-suh Park, Yongin-si, KR;

Sei-bum Ban, Seoul, KR;

Moon-sik Jeong, Seongnam-si, KR;

Yong-beom Lee, Seoul, KR;

Inventors:

Tae-suh Park, Yongin-si, KR;

Sei-bum Ban, Seoul, KR;

Moon-sik Jeong, Seongnam-si, KR;

Yong-beom Lee, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01); H04N 5/64 (2006.01); G03B 21/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus are provided for unobtrusively estimating the characteristics of a projection surface, in order to correct the distortion of images resulting from the characteristics of the projection surface in the case of a projector. The method includes projecting at least one reference pixel and at least one counterbalance pixel corresponding to the reference pixel onto consecutive image frames, and correcting an image frame to be projected using correction information determined based on photographic information of the reference pixel.


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