The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2010
Filed:
May. 18, 2005
David W. Duquette, Minneapolis, MN (US);
Eric P. Rudd, Hopkins, MN (US);
Thomas W. Bushman, Marblehead, MA (US);
Swaminathan Manickam, Wilmington, MA (US);
Timothy A. Skunes, Mahtomedi, MN (US);
Steven K. Case, St. Louis Park, MN (US);
David W. Duquette, Minneapolis, MN (US);
Eric P. Rudd, Hopkins, MN (US);
Thomas W. Bushman, Marblehead, MA (US);
Swaminathan Manickam, Wilmington, MA (US);
Timothy A. Skunes, Mahtomedi, MN (US);
Steven K. Case, St. Louis Park, MN (US);
CyberOptics Corporation, Golden Valley, MN (US);
Abstract
The present invention includes a method of determining a location of a component on a workpiece. A before-placement standard image is acquired of an intended placement location on a standard workpiece. Then, a standard component is placed upon the standard workpiece and the placement is verified. An after-placement standard image is acquired and a standard difference image is created from the before and after standard images. Then, a before-placement test image is acquired of an intended placement location on the workpiece. A component is then placed upon the workpiece, and after-placement test image is acquired. A test difference image is created from the before and after test images. A first offset is calculated between the before standard difference image and the before test image. Then, the test difference is transformed based on the first offset to generate a difference test image (DTR) that is registered to the standard difference image. The standard difference image is correlated to the registered difference test image (DTR) to generate a registration offset indicative of placement efficacy.