The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2010
Filed:
Dec. 20, 2006
Naoki Fukaya, Obu, JP;
Mikio Shimizu, Kariya, JP;
Shin Ishii, Ikoma, JP;
Tomohiro Shibata, Nara, JP;
Takashi Bando, Uji, JP;
Naoki Fukaya, Obu, JP;
Mikio Shimizu, Kariya, JP;
Shin Ishii, Ikoma, JP;
Tomohiro Shibata, Nara, JP;
Takashi Bando, Uji, JP;
Denso Corporation, Kariya, JP;
National University Corporation Nara Institute of Science and Technology, Ikoma, JP;
Abstract
An estimation device estimates a hidden state of an estimation subject from an observable state in a manner of a time series. The observable state is observed from the hidden state of the estimation subject under a procedure that has a hierarchical structure, which includes the hidden state of the estimation subject, the observable state, and an intermediate hidden state therebetween. The estimation device includes an estimation subject hidden state predicting means, an intermediate hidden state predicting means based on the state transition structure of the hidden state of the estimation subject, an intermediate hidden state likelihood observing means, an intermediate hidden state estimating means, an estimation subject hidden state likelihood observing means, estimation subject hidden state estimating means, an intermediate hidden state predicting means based on the state transition structure of the intermediate hidden state, and the mixing means.