The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2010
Filed:
Mar. 05, 2009
Geoffrey Harding, Hamburg, DE;
Stephan Olesinski, Hamburg, DE;
Dirk Kosciesza, Schleswig-Holstein, DE;
Helmut Rudolf Strecker, Hamburg, DE;
Jeffrey Seymour Gordon, Niskayuna, NY (US);
Geoffrey Harding, Hamburg, DE;
Stephan Olesinski, Hamburg, DE;
Dirk Kosciesza, Schleswig-Holstein, DE;
Helmut Rudolf Strecker, Hamburg, DE;
Jeffrey Seymour Gordon, Niskayuna, NY (US);
Morpho Detection, Inc., Newark, CA (US);
Abstract
An x-ray diffraction imaging device includes at least one x-ray detector and at least one scatter collimator positioned upstream of the at least one x-ray detector. The at least one collimator includes a plurality of successive plates. Each of the plurality of plates defines a plurality of rectangular holes. The plurality of successive plates are arranged such that the plurality of rectangular holes define a plurality of quadrilateral passages extending through the at least one scatter collimator. Each of the plurality of quadrilateral passages is configured to increase a rate of detection of first x-rays that define an x-ray transit path enclosed within a single such quadrilateral passage. Also, the plurality of quadrilateral passages is configured to decrease a rate of detection of second x-rays that define an x-ray transit path that intersects more than one such quadrilateral passage.