The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2010
Filed:
May. 24, 2007
Koichi Hirokawa, Tokyo, JP;
Taiga Goto, Tokyo, JP;
Yoshiaki Sugaya, Tokyo, JP;
Osamu Miyazaki, Tokyo, JP;
Koichi Hirokawa, Tokyo, JP;
Taiga Goto, Tokyo, JP;
Yoshiaki Sugaya, Tokyo, JP;
Osamu Miyazaki, Tokyo, JP;
Hitachi Medical Corporation, Tokyo, JP;
Abstract
An X-ray CT apparatus is provided, having a function for deciding an X-ray imaging condition prior to scanning, the X-ray imaging condition allowing an acquisition of contrast to noise ratio appropriate for identifying a diagnostic object. Prior to the real scan, a three-dimensional model of an object is estimated from scanogram projection data of the object, a contrast to noise ratio enabling identification of the diagnostic object is calculated, based on the diagnostic object size set by an operator via an operating device when planning the scan, the three-dimensional model, and a standard imaging condition that is stored in a storage device. Then, an optimum irradiated X-ray condition (tube current and tube voltage) is calculated for achieving the contrast to noise ratio enabling identification. The X-ray condition being calculated is displayed in the form of information such as image SD value and exposure dose, under the calculated X-ray condition and under other condition.