The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2010
Filed:
Dec. 04, 2006
Shoji Kuwabara, Ibaraki, JP;
Shoji Kuwabara, Ibaraki, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
An X-ray that has passed through a target objectis detected by a two-dimensional X-ray detectorcapable of energy discrimination, to determine an actual X-ray strength at a specific energy level. The target objectis rotationally scanned in predetermined angular steps around an axis perpendicular to the X-ray. The target objectis imaginarily divided into a large number of micro-sized unitary cubic cells, and each detection elementis considered to be receiving an X-ray that has passed through a plurality of unitary cubic cells. A data processorcreates a system of equations including a measured intensity ratio between the transmitted and direct X-rays and a theoretical X-ray intensity ratio calculated from the mass absorption coefficients, unknown weight ratios and density of the elements contained in each unitary cubic cell. The number of equations is equal to or larger than the total number of the elements having unknown weight ratios and the density. In this manner, one can measure the three-dimensional distribution of the weight ratio of each element and/or compound and the density in the target object containing a plurality of known kinds of elements and/or compounds.