The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2010
Filed:
Mar. 13, 2008
Yoshitaka Yamaguchi, Ashigarakami-gun, JP;
Yoshitaka Yamaguchi, Ashigarakami-gun, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Image quality of tomographic images obtained by optical tomographic measurement is improved. Spatial frequency processes are administered on a tomographic image, with the frequency processing properties (high frequency gain) in the scanning direction of a measuring light beam set to be lower than the frequency processing properties (high frequency gain) in the direction of the optical axis of the measuring light beam. For example, a smoothing process that removes high frequency components is administered to the tomographic image only in the scanning direction. Alternatively, a sharpening process that emphasizes high frequency components is administered to the tomographic image only in the direction of the optical axis. As a further alternative, a smoothing process that removes high frequency components is administered to the tomographic image in the scanning direction, then a sharpening process that emphasizes high frequency components is administered to the tomographic image in the direction of the optical axis.