The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2010
Filed:
Mar. 24, 2008
Applicant:
Myung K. Kim, Tampa, FL (US);
Inventor:
Myung K. Kim, Tampa, FL (US);
Assignee:
University of South Florida, Tampa, FL (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/021 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention provides for a digital holographic microscope using a holographic interferometer and incorporating a TIR sample mount and microscopic imaging optics. The microscope uses phase shifting from frustrated internal reflection within a prism to measure nanometric distances. The invention also provides for a numerical reconstruction algorithm of an inclined surface of the object/prism.
Kim, Myung. (2010). Total internal reflection holographic microscope (U.S. Patent No. 7812959). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7812959
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