The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2010
Filed:
Feb. 22, 2008
Evan F. Cromwell, Redwood City, CA (US);
Johann F. Adam, Palo Alto, CA (US);
Andrei Brunfeld, Cupertino, CA (US);
Paul B. Comita, Menlo Park, CA (US);
Christopher J. Seipert, San Jose, CA (US);
Evan F. Cromwell, Redwood City, CA (US);
Johann F. Adam, Palo Alto, CA (US);
Andrei Brunfeld, Cupertino, CA (US);
Paul B. Comita, Menlo Park, CA (US);
Christopher J. Seipert, San Jose, CA (US);
Blueshift Biotechnologies, Inc., Sunnyvale, CA (US);
Abstract
Methods and apparatus, including computer program products, implementing and using techniques for collecting optical data pertaining to one or more characteristics of a sample. The apparatus has a light source, one or more illumination optical elements, a scanner, one or more collection optical elements, and a device forming an aperture that limits detection of light from the sample. The illumination optical elements direct a light beam from the light source onto the sample. The scanner scans the light beam across the sample. The collection optical elements collect light from the sample and transmit the collected light to a detector. None of the collection optical elements are included among the illumination optical elements. The device forming an aperture limits detection of light from the sample to light associated with a limited vertical depth within the sample, and is one of the collection optical elements.