The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2010
Filed:
Mar. 02, 2009
Horst Knoedgen, Munich, DE;
Dirk Huettmann, Baltmannsweiler, DE;
Horst Knoedgen, Munich, DE;
Dirk Huettmann, Baltmannsweiler, DE;
Digital Imaging Systems GmbH, Kirchheim/Teck-Nabern, DE;
Abstract
A test handler is controlled by a tester to transport, select, focus and test miniature digital camera modules. The modules are loaded onto a transport tray and moved on a conveyer to a robot. The robot selects the untested modules from the tray an alternately places the modules into two test stations. A first test station focuses and tests a first module while the second test station is loaded with a second module, thus burying the handling time for the modules within the test time. The robot returns tested modules to the transport tray, and when all modules on the tray are tested, moves the tray out of the test handler. A second tray with untested modules is positioned at the robot while the tested modules of the first tray are being focus fixed and sorted into part number bins. The overlap of operations buries handling time within the focus and test time so that the limitation of total test time is depending on focus and test operations.